Name: Double plunger, push fit test probe for fine pitch components.
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

Hogar > productos > Sondas de prueba de resorte >

Double plunger, push fit test probe for fine pitch components.

double plunger test probe

push fit test probe

fine pitch spring probe

Lugar de origen:

Porcelana

Nombre de la marca:

WINNER

Certificación:

ISO9100

Éntrenos en contacto con

Pida una cita

Double plunger, push fit test probe for fine pitch components.

Detalles del producto

Nombre del producto:

sonda de prueba de resorte

barril:

PB, chapado en oro

Émbolo inferior:

BeCu/SK4, chapado en oro

Émbolo superior:

SK4(Be Cu)/chapado en oro

PRIMAVERA:

SWPB(SUS)/chapado en oro

Disponibilidad:

Tamaños personalizados disponibles

Revestimiento:

Chapado en oro

Clasificación actual:

Resistencia de contacto:

100 mohmios máximo

Ancho de banda:

-0,27 dB a 19,6 GHz

inductancia:

1,45 nH

captación:

2,01pF

Golpe completo:

2.0 mm

Trazo nominal:

1,0 mm

Fuerza de resorte:

30 gramos @ 1,0 mm

La vida mecánica excede:

200K

Resaltar:

double plunger test probe

push fit test probe

fine pitch spring probe

Pago y términos de envío

Cantidad de orden mínima

3000pcs

Precio

999

Detalles de empaquetado

Empaque neutrial o con logotipo OEM

Tiempo de entrega

5-8 días laborables

Condiciones de pago

LC, Unión Occidental, T/T

Capacidad de la fuente

100000 rollos por mes

Productos relacionados

Gold Plated High Durability Spring Test Probe

Consiga el mejor precio

Double plunger, push fit test probe for fine pitch components.

Consiga el mejor precio

Gold Plated High Durability Spring Test Probe | Custom Sizes Pogo Pin for Electronic Testing

Consiga el mejor precio

Gold Plated Spring Test Probe with 1A Current Rating and Custom Sizes for BGA Testing

Consiga el mejor precio

Éntrenos en contacto con

Contacto ahora

Descripción de producto

Electric Cable Switching Probe YF DE1-038DD115-01C0

High Efficiency BGA Testing Probes - Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications.

Key Product Features

High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Production Specifications

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

Etiquetas：

Double plunger, push fit test probe for fine pitch components.

double plunger test probe

push fit test probe

fine pitch spring probe

double plunger test probe

push fit test probe

fine pitch spring probe

Gold Plated High Durability Spring Test Probe

Double plunger, push fit test probe for fine pitch components.

Gold Plated High Durability Spring Test Probe | Custom Sizes Pogo Pin for Electronic Testing

Gold Plated Spring Test Probe with 1A Current Rating and Custom Sizes for BGA Testing

Electrónica de alambre de tungsteno recubierto de oro

I+D de alambre de tungsteno de 0

01 mm