Name: Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

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Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Lugar de origen:

Porcelana

Nombre de la marca:

WINNER

Certificación:

ISO9100

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Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Detalles del producto

Nombre del producto:

sonda de prueba de resorte

barril:

PB, chapado en oro

Émbolo inferior:

BeCu/SK4, chapado en oro

Émbolo superior:

Aleación de paladio/sin chapado

PRIMAVERA:

SWPB(SUS)/chapado en oro

Disponibilidad:

Tamaños personalizados disponibles

Revestimiento:

Chapado en oro

Clasificación actual:

Resistencia de contacto:

100 mohmios máximo

Ancho de banda:

-0,17 dB a 19,6 GHz

inductancia:

1,25 nH

captación:

1,61pF

Golpe completo:

1.00 mm

Trazo nominal:

0,65 mm

Fuerza de resorte:

30 gramos a 0,65 mm

La vida mecánica excede:

200K

Resaltar:

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Pago y términos de envío

Cantidad de orden mínima

3000pcs

Precio

999

Detalles de empaquetado

Empaque neutrial o con logotipo OEM

Tiempo de entrega

5-8 días laborables

Condiciones de pago

LC, Unión Occidental, T/T

Capacidad de la fuente

100000 rollos por mes

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Descripción de producto

High Efficiency BGA Testing Probes

Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications.

Key Product Features

Ultra-Fine Precision: 0.11 mm plunger and 0.15 mm barrel for micro-pitch PCB pads, IC leads, flex circuits, and semiconductor testing
High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Production Specifications

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

Etiquetas：

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

China Supplier ICT test probe P048

CHINA Supply YF-100 Brass Material Spring Contact Probe Pin

Precio directo de fábrica de sondas de prueba de resorte

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